representative scanning electron micrograph (Hitachi Ltd)
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Representative Scanning Electron Micrograph, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 147132 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/representative scanning electron micrograph/product/Hitachi Ltd
Average 99 stars, based on 147132 article reviews
Images
1) Product Images from "Analyte-Induced Disruption of Luminescence Quenching (AIDLuQ) for Femtomolar Detection of Biomarkers"
Article Title: Analyte-Induced Disruption of Luminescence Quenching (AIDLuQ) for Femtomolar Detection of Biomarkers
Journal: Nanoscale
doi: 10.1039/c9nr04308j
Figure Legend Snippet: a) A representative scanning electron micrograph of graphene coated paper. The graphene flakes are ~5 nm thick with lateral dimensions in the range of few μm. The scale bar is 20 μm, b) The emission of CdSe QDs on graphene is strongly quenched due to interactions between pi-electron clouds of graphene and d-orbitals of CdSe QDs. The inset shows a very weak quenched emission peak for CdSe QDs on graphene.
Techniques Used: